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Revista mexicana de física
Print version ISSN 0035-001X
Rev. mex. fis. vol.59 n.3 México May./Jun. 2013
Research
The study of electro-optical properties of nanocomposite ITO thin films prepared by e-beam evaporation
M. Farahamndjou
Department of physics, Varamin Pishva Branch, Islamic Azad University, Varamin, Iran, Tel: +982136725011-14, e-mail: farahmandjou@iauvaramin.ac.ir
Received 17 September 2012;
Accepted 6 February 2013
Abstract
Indium-tin oxide thin films are deposited on sods lime glass substrates using e-beam evaporation system. In order to improve the structural, electrical and optical properties of the films, these films were annealed in vacuum and different temperature. The structure, sheet resistance and optical transmission of the films were systematically investigated as function of post annealing temperature. It has been observed that the films take its maximum transmission and conductivity at annealing temperature 400°C. The XRD and AFM analysis reveals that the amorphous films were oriented to (222) crystal texture direction with size of grains about 35-40 nm.
Keywords: ITO Nano-composite; crystallity; optical transmission; Thin Films.
PACS: 73.63.Bd; 78.67.Bf; 78.67.Sc
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Acknowledgments
The author is thankful for the financial support of Karaj material and energy research center for analysis and the discussions on the results.
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