Abstract

FIGUEROA RESENDIZ, B. E.; MAYA SANCHEZ, M. C.  and  REYNOSO HERNANDEZ, J. A.. Common-source cold-FET used to validate noise figure measurements and on-wafer FET noise parameters. Rev. mex. fis. [online]. 2013, vol.59, n.6, pp.560-569. ISSN 0035-001X.

This work proposes the use of a common-source cold-FET with gate forward biased to validate the noise figure measurements and the noise parameters of on-wafer transistors. Since a common-source cold-FET behaves as an attenuator, its noise figure and noise parameters can be determined from S-parameters measurements. Three methods for determining the noise parameters of the common-source cold-FET are investigated. The first one uses the noise correlation matrix for passive devices (the S-parameters), the second one is the tuner method and the third one is the F₅₀ method. The noise figure measured and the noise figure computed from S-parameters agree quite well. The noise parameters extracted with the tuner method and the F₅₀ method show good correlation with the noise parameters computed with the S-parameters. These results validate both the noise figure measurements and the noise parameters extraction.

Keywords : Noise figure; noise parameters; cold-FET; source-pull tuner method; F₅₀ method.