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Ingeniería, investigación y tecnología

On-line version ISSN 2594-0732Print version ISSN 1405-7743

Abstract

NUNEZ-PEREZ, Ricardo Francisco. The Tendency of the Crest Factor Helps Detect Nascent Events; Electronic Circuit, Software and Applications to Signals from Diverse Fields. Ing. invest. y tecnol. [online]. 2014, vol.15, n.1, pp.63-81. ISSN 2594-0732.

Within the signal analysis techniques in the time domain, the crest factor (CF) is undoubtedly one of the most simple and fast to implement using electronic circuits and/or software. That's why it has been used reliably to care for machinery and to evaluate the quality of supply. One of the major manufacturers of instruments for these purposes is Bruel and Kjaer and defines the crest factor of voltage or repetitive current signal as the ratio of the peak level and its rms value during a certain period of time. In this paper, we try to find out experimentally the potential of CF and their tendency to detect the nascent and evolution of events in various fields of knowledge, either by generating it with a developed electronic circuit, or with calculations, through routines that are performed with the programs DADISP and LabVlEW. The results are validated and checked for all the above factors and trends through a comparison between them and the proposed features and specifications. The results were acceptable so that the tools were applied to detect early faults in electrical machines, to identify chaosity differences between the circuits with these dynamics, to detect abnormal respiratory distress or rales in patients and to detect harmful distortions in the electrical current, all this based on simulations and measurements for each of the 4 cases studied. Other CF original applications proposed are: a) control of chaos in electronic circuits that stir/ mix industrial processes and b) correct the power factor of non-linear and inductive loads. A medium-term study and use a CF that considers the maximum signal peak to peak is contemplated, and it is thought that it can improve event detection.

Keywords : crest factor; trend; chaotic circuits; care of machinery; electrical distortion.

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