Abstract

AGUILAR, J.O. et al. Degradación de películas delgadas de sulfuro de cobre en ambiente costero. Superf. vacío [online]. 2010, vol.23, n.1, pp.6-12. ISSN 1665-3521.

Optical degradation rate of CuS semiconductor thin films exposed to atmosphere was presented. The EDAX showed an increment of oxygen contents (3.6% to 9.5% w/w) in thin films exposed to atmosphere in comparison with the stored in plastic bags which lead to fast degradation. The CuS thin film optical characterization shows, that the thin films aging it cause a major transmittance values in ultraviolet, visible and near infrared spectral regions, which means a thermal load gain trough this films. This variation in the optical parameters is closely related to the reduction of Cu in the thin film.

Keywords : Thin films; Degradation; Transmittance; Specular reflectance; CuS.