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Mundo nano. Revista interdisciplinaria en nanociencias y nanotecnología
versión On-line ISSN 2448-5691versión impresa ISSN 2007-5979
Resumen
LIZARDI NIETO, Víctor José y GONZALEZ ROJANO, Norma. Centro Nacional de Metrología. Mundo nano [online]. 2016, vol.9, n.16, pp.168-178. Epub 28-Ago-2020. ISSN 2448-5691. https://doi.org/10.22201/ceiich.24485691e.2016.16.56911.
Metrology plays an important role in a sustainable, efficient and technological society. The Centro Nacional de Metrologia, CENAM, was created to support the National Metrology System. The main objectives are to establish and maintain the National Measurement Standards and certify reference materials, to assure the uniformity of measurements in Mexico. Progress in technology and achieving a competitive market promote the technological development of dynamic, mature and emerging sectors. It is clear that emerging technologies like Nanotechnology have the potential of applications and benefits to the economy. On the other hand, support the environment and human health protection in the country as well. However, one important challenge is the availability of the metrological infrastructure required to underpin their development. This article describes briefly CENAM’s Metrology for Nanotechnology Programme, established with the aim of responding in a systematic way to the nanoscale measurement needs and outline perspectives to support nanosciences and take advantage of nanotechnologies.
Palabras llave : Metrology; measurement standards; nanotechnology; measurements; ProMetNano.