Investigación

 

Computation of crack tip elastic stress intensity factor in mode I by in–plane electronic speckle pattern interferometry

 

J. Parra–Michel, A. Martínez, and J.A. Rayas

 

Centro de Investigaciones en Óptica A.C., Lomas del Bosque 115, Col Lomas del Campestre León Guanajuato, México, email: jrpmichel@cio.mx

 

Recibido el 15 de abril de 2010
Aceptado el 9 de octubre de 2010

 

Abstract

In this work, a dual illumination beam system is used to obtain the stress intensity factor in modes one (mode I) to mechanical elements during tension testing. The displacement field is obtained by means of electronic speckle pattern interferometry and phase stepping technique. Deformations are calculated by the Stokes differentiation method. Results are compared with a numerical simulation using a finite element analysis technique.

Keywords: Stress intensity factor; ESPI; Stokes method; phase stepping.

 

Resumen

En este trabajo un sistema de iluminación dual es utilizado para la obtención del factor de concentración de esfuerzos en el primer modo (modo I) en un elemento mecánico durante la prueba de tensión, los campos de desplazamiento son obtenidos por Interferometría Electrónica del Moteado y la técnica de corrimiento de fase. Las deformaciones son calculadas mediante el método de diferenciación de Stokes. Los resultados obtenidos son comparados mediante una simulación usando el análisis de elemento finito.

Descriptores: Factor de intensidad de esfuerzo; interferometría electrónica de patrón de moteado; método de Stokes; corrimiento de fase.

 

PACS: 42.30.Ms; 02.60.Jh; 81.40Jj; 81.40.Np

 

DESCRAGAR ARTÍCULO EN FORMATO PDF

 

Acknowledgements

Authors wish to thank economical support from Consejo Nacional de Ciencia y Tecnología (CONACYT).

 

References

1. T.J. Dolan, SESA J. Exp. Mech. 10 (1970) 1.         [ Links ]

2. J. Marin, Engineering Materials (Prentice–Hall, Englewood Cliffs, N.J., 1952).         [ Links ]

3. N.E. Dowling, Mechanical Behavior of Materials (Prentice Hall, Englewood Cliff, N.J., 1993).         [ Links ]

4. J. Thomas Dolan, Physical properties; ASME handbook–metals Engineering design (McGraw–Hill, New York, 1953).         [ Links ]

5. K. Ramesh and P.M. Pathank, Commun. Numer. Methods Eng. 15 (1999) 229.         [ Links ]

6. M. Ravichandran, P.R.D. Karthick Babu, V. Rao, and K. Ramesh, Strain 43 (2007) 119.         [ Links ]

7. L. Yang and A. Ettemeyer, Opt. Eng. 42 (2003) 1257.         [ Links ]

8. D.B. Barker and M.E. Fourney, Exp. Mech. 17 (1977) 241.         [ Links ]

9. A.J. Moore and J.R. Tyrer, Opt. Lasers Eng. 24 (1996) 381.         [ Links ]

10. P.K. Rastogi, "Digital Speckle Pattern Interferometry and Related Techniques" (John Wiley & sons, Ltd. England, 2001).         [ Links ]

11. K. Creath, Appl. Opt. 24 (1985) 3053.         [ Links ]

12. L.P. Pook, Linear Elastic Fracture Mechanics for Engineers, Theory and Applications (WIT Press, Southampton, Boston, 2000).         [ Links ]

13. N.E. Dowling, Mechanical Behavior of Materials (Prentice Hall, Englewood Cliff, N.J., 1993).         [ Links ]

14. R.E. Peteson, Stress concentration factors (John Wiley & Son, New York, 1975).         [ Links ]

15. F. Erdogan, J. Appl. Mech. 50 (1983) 992.         [ Links ]

16. S.N. Atluri and A.S. Kobayashi, Handbook on experimental mechanics, 2nd ed. (ed. Kobayashi A.S.VCH SEM, New York, 1993).         [ Links ]

17. W.J. Dally, C.A. Sciammarella, and J. Shareef, "Determination of Stress Intensity Factor K from In–plane Displacement Measurements" (Proc. of the Vth International Congress on Experimental Mechanics, Montreal 1984).         [ Links ]

18. S. Yoneyama, T. Ogawa, and Y. Kobayashi, Eng Fract Mech 74 (2007) 1399.         [ Links ]

19. T.L. Anderson, Fracture mechanics, Fundamentals and applications 2nd ed (CRC Press, Boca Raton, FL, 1991).         [ Links ]

20. A. Martínez, J.A. Rayas, and R. Cordero, Opt. Comm. 262 (2006) 8.         [ Links ]

21. H. Fan, J. Wang, and Y. Tan, Opt. Lasers Eng. 28 (1997) 249.         [ Links ]

22. A. Martínez, J.A. Rayas, C. Meneses–Fabián, and M. Anguiano–Morales, Opt. Comm. 281 (2008) 4291.         [ Links ]

23. T. Kreis, Holographic Interferometry, principles and methods (Akademie Verlag, Berlin, 1996).         [ Links ]

24. I. Lira, R.R. Cordero, M. François, and C. Vial–Edwards, Meas. Sci. Technol. 15 (2004) 2381.         [ Links ]

25. M. Raffel, C. Willert, and J. Kompenhans, Particle Image Velocimetry: A Practical Guide 1st ed, (Springer, Berlin, 1998); A.A. Kotlyarenko, T.A. Prach, V.V. Kharchenko, and A. Yu. Chirkov Strength of Materials 41 (2009) 106.         [ Links ]

26. Rahman, I. Qazi, Schmeisser, and Gerhard, Numerische Mathematik 57 (1990) 123.         [ Links ]

27. G. Villanueva, J.A. Plaza, E. Gonzalez, and J. Bausells, Microsyst Technol 12 (2006) 455.         [ Links ]