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Mundo nano. Revista interdisciplinaria en nanociencias y nanotecnología
versión On-line ISSN 2448-5691versión impresa ISSN 2007-5979
Resumen
APARICIO CEJA, Martha Eloísa y CARBAJAL ARIZAGA, Gregorio Guadalupe. Utilidad de la difracción de rayos x en las nanociencias. Mundo nano [online]. 2010, vol.3, n.2, pp.62-72. Epub 06-Sep-2021. ISSN 2448-5691.
X-ray diffraction (XRD) has been a useful tool to study minerals, compounds and materials for the past century. Nanosciences discovered new phenomena and properties in matter with nanometric dimensions. Several instruments of solid state analysis (like XRD) were applied to the study of nanometric systems. Our article reviews some studies conducted especially in Latin America where XRD played a key role in the analysis of nanometric materials.
Palabras llave : diffraction; x-ray; nanoscience.