SciELO - Scientific Electronic Library Online

 
vol.18 número3Characterization by photoreflectance of E 0 ´ and E 1 silicon-like critical points in ion implanted Si 1-y C y thin filmsInfrared and Raman characterization of amorphous carbon nitride thin films prepared by laser ablation índice de autoresíndice de assuntospesquisa de artigos
Home Pagelista alfabética de periódicos  

Serviços Personalizados

Journal

Artigo

Indicadores

Links relacionados

  • Não possue artigos similaresSimilares em SciELO

Compartilhar


Superficies y vacío

versão impressa ISSN 1665-3521

Resumo

SALAZAR-PEREZ, A. J. et al. Structural evolution of Bi 2 O 3 prepared by thermal oxidation of bismuth nano-particles. Superf. vacío [online]. 2005, vol.18, n.3, pp.4-8. ISSN 1665-3521.

Bismuth nano-sized particles were prepared by the chemical reduction method. These particles were characterized by HR-TEM, X-Ray Diffraction and Micro-Raman Spectroscopy. In order to obtain bismuth oxide, the as-obtained bismuth nano-particles were thermally treated in air at various temperatures in the range 100-750 0C during 30 min. The thermally treated samples were studied by Micro-Raman Spectroscopy. Additionally, information on the chemical composition and morphology was obtained by Energy Dispersive Spectroscopy and Scanning Electron Microscopy, respectively. Results show that bismuth nano-particles were oxidized at 100 oC and transformed into three of the five phases of Bi2O3 reported in literature; the obtained phase depends on the annealing temperature. The β-Bi2O3 phase was obtained for 200-300 0C, α-Bi2O3 for 400-600 0C and finally γ-Bi2O3 for 700-750 0C.

Palavras-chave : Bismuth oxide; Thermal oxidation; Micro-Raman spectroscopy.

        · texto em Inglês