Resumo

MENDOZA RAMIREZ, Miriam-Carolina  e  AVALOS BORJA, Miguel. Nanostructures and their characterization by transmission electron microscopy; science and art. Mundo nano [online]. 2020, vol.13, n.25, pp.61-78.  Epub 25-Nov-2020. ISSN 2448-5691.  https://doi.org/10.22201/ceiich.24485691e.2020.25.69630.

The description of nanometric systems is still being a challenging topic, for this reason the transmission electron microscopy (TEM) scope is exemplified in a didactic way using several nanosystems (Au nanoparticles and thin Si films). Throughout this work, conventional TEM techniques such as bright field (BF), dark field (DF), high angle annular dark field (HAADF), selected area electron diffraction (SAED) and electron energy loss spectroscopy (EELS) are shown, emphaticizing the differences with less conventional techniques such as convergent beam electron diffraction (CBED), large angle convergent beam electron diffraction (LACBED) and precession electron diffraction (PED). Also, some practical suggestions are given for describing contrast found on several TEM techniques, offering a striking, clear and didactic vision of the current scopes of TEM in Mexico.

Palavras-chave : transmission electron microscopy; electron diffraction; precession and convergent beam.

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