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Revista mexicana de física
versão impressa ISSN 0035-001X
Resumo
GERVACIO ARCINIEGA, J.J.; PROKHOROV, E. e ESPINOZA BELTRAN, F.J.. Propiedades ferroeléctricas de películas delgadas de GeSbTe. Rev. mex. fis. [online]. 2011, vol.57, n.2, pp.172-175. ISSN 0035-001X.
The aim of this work is to investigate and compare ferroelectrical properties of thin GeSbTe films with composition Ge4Sb1Te5 (with well defined ferroelectrical properties) and Ge2Sb2Te5 using impedance, optical reflection, XRD, DSC and Piezoresponse Force Microscopy techniques. The temperature dependence of the capacitance in both materials shows an abrupt change at the temperature corresponding to ferroelectric-paraelectric transition and the Curie-Weiss dependence. In Ge2Sb2Te5 films this transition corresponds to the end from a NaCl-type to a hexagonal transformation. Piezoresponse Force Microscopy measurements found ferroelectric domains with dimension approximately equal to the dimension of grains.
Palavras-chave : Ferroelectric; domains; capacitance; Curie-Weiss dependence.